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Revolutionize Your Surface Analysis with Fiber Optic Spectrometer for Film Thickness Measurement

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Revolutionize Your Surface Analysis with Fiber Optic Spectrometer for Film Thickness Measurement

Name: Revolutionize Your Surface Analysis with Fiber Optic Spectrometer for Film Thickness Measurement
Brand: JINSP
Price: 1 USD

Wholesale Revolutionize Your Surface Analysis with Fiber Optic Spectrometer for Film Thickness Measurement from china suppliers

Brand Name : JINSP

Model Number : SR100Q

Certification : ISO9001

Place of Origin : CHINA

MOQ : 1

Price : Negotiable

Payment Terms : T/T, Western Union

Supply Ability : 100PCS/90-120 days

Delivery Time : 90-120 working days

Packaging Details : International Shipping Pakcage

Spectrual Range : 200nm - 1100nm

Effective pixels : 1024*122

Qutuam Efficiency : QE92%peak@650nm, 83%@232nm

SNR : 1000:1

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92% High Quantum Spectrometer for Film Thickness Measurement

In sectors dependent on thin film coatings, accurate thickness data ensures optimal product functionality. Photoelectric measurement systems offer the perfect balance of speed and safety. When enhanced with predictive algorithms, these technologies empower manufacturers to achieve new standards of efficiency and innovation.

The JINSP SR100Q spectrometer is integrated with the Hamamatsu S7031, a scientific-grade TE-cooled area array CCD chip. With a pixel size of up to 24*24μm and excellent quantum efficiency of up to 92%, it ensures high response in the ultraviolet band and effectively improves the sensitivity and SNR of weak signals. Furthermore, it can realize excellent spectrum signals, and stable and reliable performance based on the advanced high-resolution light path and low-noise, high-speed FPGA signal processing chip.

Product Parameters:

Detector	Chip Type	Back-illuminated TE-cooled Hamamatsu S7031
	Effective Pixel	1024*122
	Pixel Size	24*24μm
	Sensing Area	24.576*2.928mm
Optical Parameters	Optical Design	F/4 cross-type
	Numerical Aperture	0.13
	Focal Length	100mm
	Entrance Slit Width	10μm,25μm,50μm,100μm,200μm (customizable)
	Fiber Interface	SMA905,free space
Electrical Parameters	Integration Time	8ms-3600s
	Data Output Interface	USB3.0,RS232,RS485,20pin connector
	ADC Bit Depth	16-bit
	Power Supply	5V
	Operating Current	<3.5A
Physical Parameters	Operating Temperature	10℃~40℃
	Storage Temperature	-20℃~60℃
	Operating Humidity	<90%RH (no condensation)
	Dimensions	180mm120mm50mm
	Weight	1.2kg

List of Product Models:

Model	Spectral Range(nm)	Resolution(nm)	Slit(μm)
SR100Q-G21 SR100Q-G22	200~950 350~1100	6.8	200
		2.2	50
		1.5	25
		1.0	10
SR100Q-G23 SR100Q-G24	200~775 350~925	1.6	50
		1.0	25
		0.7	10
SR100Q-G25	532~690(4400cm-1)	13cm-1	50
SR100Q-G26	638~800(3200cm-1)*	10cm-1	25
SR100Q-G27	785~1050(3200cm-1)*	11cm-1	50

**Note: The*are primarily designed for Raman applications, with the corresponding Raman.**

Technical Characteristics:

High quantum efficiency, 92%peak@650nm, 83%@232nm
High SNR: Ultra-low dark noise under long integration time, SNR is as high as 1000:1

Noise-free clear processing of weak signal in long exposure, strong adaption to environment
Low-noise and high-speed circuit: USB3.0

Measurement Method:

The system uses an optical fiber to project light onto the film, creating reflections at its upper and lower boundaries. The resulting interference spectrum, acquired by the spectrometer, facilitates thickness (d) computation via the extremum method (incorporating θ, n, and spectral peaks/troughs). Fringe frequency rises with thickness but falls with wavelength. Accurate readings depend on spectral parameter optimization.

Revolutionize Your Surface Analysis with Fiber Optic Spectrometer for Film Thickness Measurement

Typical Applications:

Detect absorption, transmittance and reflection Spectrum
Light source and laser wavelength characterization
OEM product module: Fluorescence spectrum, Raman spectrum, etc.

Revolutionize Your Surface Analysis with Fiber Optic Spectrometer for Film Thickness Measurement

Company Introduction:

JINSP Company Limited, abbreviated as "JINSP", is a professional supplier with over 17 years of experience in spectral detection technology products, including Raman, FT-IR, LIBS technologies, etc. After 17 years of technology accumulation, the company’s core key technologies have reached the international leading position at the level, and the cumulative number of patent applications exceeded 200.

In addition to its main headquarters located in the bustling city of Beijing, JINSP has established a fully owned subsidiary manufacturing facility situated in the province of Jiangsu, China.

JINSP Company received ISO9001:2015, ISO14001:2015, and ISO45001:2018 certifications. JINSP can provide required certifications, such as certification by the Ministry of Public Security or National Institute of Metrology, Environmental Level Certification, IP Level Certification, CE Certification, Transport Identification Report, EU ECAC certification, German ICT Security Testing, etc.

FAQ

Q1:This is the first time I use, is it easy to operate?

A1:We will send you manual and guide vedio in English,it can teach you how to operate the spectrometer. Also our technicians will offer professional tecnical opearation meetings.

Q2: Can your offer a operation traning?
A2: Your technicians can come to our factory for a training. Jinsp engineers can go to your place for local support
( installation, training, debugging, maintenance ).

Q3: What's your website?
A3:You can visit:www.jinsptech.com

Q4: What about your quality assurance?

A4: We have a quality inspection team. All goods will go through quality inspection before shipment. We can send you pictures for inspection.

Product Tags:

Film Thickness Fiber Optic Spectrometer

Fiber Optic Spectrometer for Film Measurement

Revolutionize Your Surface Analysis with Fiber Optic Spectrometer for Film Thickness Measurement Images

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